Testability of VLSI

Lecture 6B: Introduction to Automatic Test Pattern Generation

Testing, Thermal Imaging, Functional Versus Structural Testing, Logic verification of a 32-bit ripple-carry adder, ATPG, Exhaustive, Random, Deterministic ATPG, Symbolic – Boolean Difference, Solved Examples of Boolean Difference, Problems and Solutions Boolean Difference, ATPG Algebra, D algebra Single Fault, Problems and Solutions D algebra, Solved Examples of D algebra, Static Glitch Example, Redundancy Definition for Testing Purposes.

Lesson Intro Video

Lecture 6A: Testability Measures (Prev Lesson)
(Next Lesson) Lecture 07: Automatic Test Pattern Generation for Combinational Circuits
Back to Testability of VLSI

No Comments

Give a comment