Testability of VLSI

Lecture 6A: Testability Measures

Fault Simulation, TESTABILITY MEASURES, Setting Difficulty levels, CC-Combinational Controllability, SCOAP Controllability and Observability, Sandia Controllability/Observability Analysis Program, 1. Combinational 0-controllability, CC0(l) 2. Combinational 1-controllability, CC1(l) 3. Combinational observability, CO(l) 4. Sequential 0-controllability, SC0(l) Sequential 1-controllability, SC1(l) 6. Sequential observability, SO(l). Solved Examples of SCOAP, Problems and Solutions SCOAP.

Lesson Intro Video

Lecture 5: Fault Simulation (Prev Lesson)
(Next Lesson) Lecture 6B: Introduction to Automatic Test Pattern Generation
Back to Testability of VLSI

No Comments

Give a comment