Fault Simulation, TESTABILITY MEASURES, Setting Difficulty levels, CC-Combinational Controllability, SCOAP Controllability and Observability, Sandia Controllability/Observability Analysis Program, 1. Combinational 0-controllability, CC0(l) 2. Combinational 1-controllability, CC1(l) 3. Combinational observability, CO(l) 4. Sequential 0-controllability, SC0(l) Sequential 1-controllability, SC1(l) 6. Sequential observability, SO(l). Solved Examples of SCOAP, Problems and Solutions SCOAP.
Testability of VLSI
Course Curriculum
- Lecture 1: Introduction to VLSI Testing1 hour 26 mins
- Lecture 2: Fault Modelling1 hour 41 mins
- Lecture 3: Fault Collapsing1 hour 35 mins
- Lecture 4: Logic Simulation1 hour 30 mins
- Lecture 5: Fault Simulation1 hour 31 mins
- Lecture 6A: Testability Measures58 mins
- Lecture 6B: Introduction to Automatic Test Pattern Generation40 mins
- Lecture 07: Automatic Test Pattern Generation for Combinational Circuits1 hour 19 mins
- Lecture 08: Testing of Sequential Circuits1 hour 35 mins
- Lecture 09: Testing of Memory1 hour 49 mins
Teacher

Sanjay Vidyadharan
Role : Professor
- Website : https://universe.bits-pilani.ac.in/pilani/vidhyadharan/Profile
- Experience : 25 Years
- Specialist in : Electronics and Electrical Engineering
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