Testability of VLSI

Lecture 2: Fault Modelling

Defects, Errors, and Faults, Fabrication Faults, Fault Models, Functional Versus Structural Testing, Common Structural Fault Models, Single stuck-at faults, Multiple Stuck-at faults, Transistor open and short faults, Bridging Faults, Delay faults (transition, path). Cell Aware Fault Model

Lesson Intro Video

Lecture 1: Introduction to VLSI Testing (Prev Lesson)
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