Testability of VLSI

Design for Testability, Observability & Controllability, Ad Hoc Design for Testability, Method of Test Points, Improving controllability, Multiplexing monitor points, demultiplexer for control points, scan design, A single-clock scan flip-flop, A two-clock scan flip-flop, Scan Design Rules, Scan test length, Overheads of Scan Design, Gate overhead, Area overhead, Performance overhead, Design Automation, full-scan design, Partial-Scan Design, Scan-Hold Flip-Flop (SHFF), Random-Access Scan (RAS).