Testability of VLSI

Functional Versus Structural Testing, Single Stuck-at faults, Delay faults, Transistor faults, Fault Detection, Fault Sensitization, Fault Propagation, Fault Justification, Fault Detectability, Fault Coverage, Fault Equivalence, Equivalence Fault Collapsing, Dominance Fault Collapsing, Checkpoint Theorem, Collapse Ratio, Simulation for Design Verification, True Value Simulation, Fault simulation for test generation.