Testability of VLSI

Lecture 07: Automatic Test Pattern Generation for Combinational Circuits

ATPG Algorithm, Roth’s D-Algorithm (D-ALG), Goel’s PODEM algorithm, Fujiwara and Shimono’s FAN algorithm, Prime Implicants, D-Calculus and D-Algorithm (Roth), singular cover, D-frontier, Unique D-frontier, J-frontier, Primitive D-cubes of failure (PDCF), Forward implication, Backward implication, D-Drive , Advantages and disadvantages of D-Calculus and D-Algorithm (Roth)

Lesson Intro Video

Lecture 6B: Introduction to Automatic Test Pattern Generation (Prev Lesson)
(Next Lesson) Lecture 08: Testing of Sequential Circuits
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