Testing, Thermal Imaging, Functional Versus Structural Testing, Logic verification of a 32-bit ripple-carry adder, ATPG, Exhaustive, Random, Deterministic ATPG, Symbolic – Boolean Difference, Solved Examples of Boolean Difference, Problems and Solutions Boolean Difference, ATPG Algebra, D algebra Single Fault, Problems and Solutions D algebra, Solved Examples of D algebra, Static Glitch Example, Redundancy Definition for Testing Purposes.
Testability of VLSI
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- Experience : 25 Years
- Specialist in : Electronics and Electrical Engineering
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